The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 1997
Filed:
Jul. 07, 1995
Seth David Silverstein, Schenectady, NY (US);
Robert Leland Nevin, Schenectady, NY (US);
William Ernest Engeler, Scotia, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and apparatus for remotely calibrating a system having a plurality of N elements, such as a phased array system, is provided. The method includes generating coherent signals, such as a calibration signal and a reference signal having a predetermined spectral relationship between one another. The calibration signal which is applied to each respective one of the plurality of N elements can be orthogonally encoded using a unitary transform encoder that uses a predetermined transform matrix, such as a Hadamard transform matrix or a two-dimensional discrete Fourier transform matrix, to generate a set of orthogonally encoded signals. The set of orthogonally encoded signals and the reference signal are transmitted to a remote location. The transmitted set of orthogonally encoded signals is coherently detected at the remote location. The coherently detected set of orthogonally encoded signals is then decoded using the inverse of the predetermined encoding matrix to generate a set of decoded signals. The set of decoded signals is then processed for generating calibration data for each element of the phased array system.