The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 1997
Filed:
Sep. 20, 1994
Applicant:
Inventors:
Shinji Satomura, Amagasaki, JP;
Hideo Katoh, Amagasaki, JP;
Kenji Nakamura, Amagasaki, JP;
Kazunari Hirayasu, Amagasaki, JP;
Assignee:
Wako Pure Chemical Industries, Ltd., Osaka, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436501 ; 435-792 ; 435-793 ; 435-794 ; 436530 ; 436536 ; 436538 ; 436539 ; 436540 ; 436541 ; 436805 ; 436824 ; 436827 ;
Abstract
Trace components in samples can be measured rapidly with high precision by applying interaction between an analyte to be measured and an affinity substance and using a membrane having specific separating capability.
Satomura, Shinji. (1997). Process for rapid measurement of trace components (U.S. Patent No. 5677194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5677194
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile