The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 1997
Filed:
Apr. 30, 1996
Wilson K Yee, Tracy, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A circuit and method for testing Field Programmable Gate Arrays (FPGAs) comprises a programmable multiplexer for sequentially connecting columns of logic cells to enable the configuring of logic cell columns into one or more scan chains. Each column of logic cells contains an edge cell comprising a multi-input multiplexer, one of the multiplexer inputs being dedicated to receiving a signal from an adjacent cell, other of the inputs being connected to gate array input pads. A programmable control signal on the multiplexer enables the column to either receive test data from one of the gate array input pads or to connect as part of a scan chain by receiving a wrapping signal from the output logic cell of an adjacent column.