The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 1997
Filed:
Apr. 26, 1995
Stephen L Pentoney, Jr, Yorba Linda, CA (US);
David J Rakestraw, Fremont, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A detection system for sequentially and repetitively scanning a plurality of sample volumes and detecting electromagnetic radiation emitting from each of the sample volumes includes a plurality of coplanar side-by-side capillaries each containing a sample volume, an electromagnetic radiation source, a mirror aligned to receive and reflect electromagnetic radiation, a scanner for moving the mirror, and a detector aligned to receive electromagnetic radiation collected from the sample volumes. In operation, the scanner adjusts the mirror position so that the mirror is positioned to receive the electromagnetic radiation from the electromagnetic radiation source and reflect the electromagnetic radiation sequentially and repetitively to the sample volumes. Emitted electromagnetic radiation from the sample volume is collected and directed to a detector where a signal is generated in response to the interaction of the electromagnetic radiation with the sample.