The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 1997
Filed:
Dec. 22, 1994
Alexander Saunders, San Carlos, CA (US);
Michael Allan Zarowitz, San Carlos, CA (US);
Chronomed, Inc., San Carlos, CA (US);
Abstract
A method is provided for measuring an analyte in a sample comprising adding substantially transparent particles to a sample in solution or suspension, said particles having an affinity for said analyte; fractionating the particles from the solution or suspension to form a particle-rich fraction and a substantially particle-free fraction; optically reading the particle-rich fraction at a first and a second wavelength; optically reading the substantially particle-free fraction at at least the first wavelength; and correlating the readings through the particle-rich fraction and the substantially particle-free fraction of the sample, with similar measurements in a particle-containing 'blank' to obtain a quantitative determination of the analyte originally present in the sample.