The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 1997
Filed:
Jan. 30, 1996
Shigeo Hattori, Kobe, JP;
Toshiaki Yutori, Kobe, JP;
Nobuhiro Hara, Kobe, JP;
Kunihiko Nishioka, Kobe, JP;
Masahiko Uchimura, Kobe, JP;
Toshiaki Okumura, Kobe, JP;
Masakazu Nakao, Kobe, JP;
Kabushiki Kaisha Kobe Seiko Sho, Kobe, JP;
Abstract
A probe unit comprising a base in the form of a rectangular plate and a plurality of ultrathin metal wires which are partially secured to the base at a given pitch. Each of the wires comprises a straight portion firmly secured to the base, a bent portion located on an extension of the straight portion, and an inclined portion inclined from the bent portion outwardly of the base toward an inspected surface of an object to be inspected, and an R-shaped portion extending from the front end of the inclined portion outwardly of the base. The bent portion protrudes outwardly from the base and is bent toward the inspected surface. The R-shaped portion forms each probe pin bearing against the inspected surface.