The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1997
Filed:
Nov. 19, 1996
Thomas Niklaus Hangartner, Xenia, OH (US);
Wright State University, Dayton, OH (US);
Abstract
A method and apparatus are provided for the measurement of structural width and density with a CT scanner. The density of a particular structure is determined by establishing a radial density profile of a structure, identifying a peak density value along said density profile, interpolating a first curve of density versus width from a point defined by the structural width and the peak density value, and identifying a maximum density value of said first curve to establish a structural density value. The width of the structure is determined by identifying first and second radial positions corresponding to respective points on said radial density profile where the profile rises above and falls below first and second threshold values, measuring a difference between said first radial position and said second radial position, and determining the width of the structure as a function of the measured difference.