The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 1997

Filed:

Aug. 13, 1996
Applicant:
Inventors:

Rodolfo F Garcia, San Jose, CA (US);

Egbert Graeve, Los Altos, CA (US);

Assignee:

Schlumberger Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 221 ;
Abstract

A test system, for testing circuits, having two operating modes, a normal mode and an accelerated mode. The test system has a first start memory, a second start memory, a first sequence memory, and a second sequence memory. The start memories provide sequence memory addresses for addressing the sequence memories, and the sequence memories provide event sequences in response to sequence memory addresses. If operating in normal mode, the start memories are electronically coupled (switched) to provide a single sequence memory address to both sequence memories. If operating in accelerated mode, the start memories are electronically coupled so that the first start memory provides a first sequence memory address to the first sequence memory and the second start memory provides an independent second sequence memory address to the second sequence memory. In particular embodiments, the first and second start memories are of the same size, the first and second sequence memories are of the same size, and the sequence memories produce a word including at least two events in response to a sequence memory address. In a further embodiment, the test system has three operating modes: normal, accelerated, and double-accelerated. For the double-accelerated mode, four start memories and four sequence memories are provided.


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