The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1997
Filed:
Apr. 10, 1995
David A Chapin, Plano, TX (US);
Charles C Mosher, Plano, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
A method of analyzing geological survey data of the potential field measurement type is disclosed. According to the disclosed method, discrete measurement values of the potential field, either the gravitational or magnetic field, are retrieved from memory, corresponding to either a one-dimensional or two-dimensional survey region of the earth. The discrete values are first preconditioned by the application of a noise-reduction digital filter, preferably of the Weiner type. The disclosed method then performs decomposition of the filtered discrete values using the Daubechies scale function and wavelet function of length 2. According to the preferred method, the second level low-frequency component of the first level high-frequency component is generated, and expanded by a factor of four to correspond to the range of the input discrete values. Interpolation is performed to fill in values between adjacent coefficients of this component. As a result of the disclosed method, resolution of geological structures is much improved, enabling detection and discrimination of complex and interfering structures at increased depths.