The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1997
Filed:
Oct. 31, 1994
Roger A Morton, Penfield, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for making large format lenticular 3-D images by enlarging a smaller source image utilizes an optical enlarger that is calibrated by forming a first reference image pattern from a first piece of lenticular material having the same pitch as a second piece of lenticular material, and a second reference image comprising lines having a pitch corresponding to the spacing between the same views of the source image. The source image is derived by photographing an original scene from different views taken from spaced apart positions. The first reference image is positioned at a copy plane and the second reference image is positioned at the source plane. The relative orientation of the reference images are adjusted to provide a Moire pattern that achieves desired spacing and parallelism. With the adjustment of the enlarger optics completed, the source image is positioned at the source plane and an enlargement is made at the copy plane. The enlarged image, formed at the copy plane, will accurately align with the lenticules of the second piece of lenticular material to provide a superior large format lenticular 3-D image.