The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 1997

Filed:

Dec. 26, 1995
Applicant:
Inventors:

Andreas Dorsel, Menlo Park, CA (US);

Karl-Heinz Donnerhacke, Jena, DE;

Beate Moeller, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ; 351205 ; 351221 ;
Abstract

An arrangement for measuring intraocular distances between different optical boundary surfaces of the human eye by at least one interferometric measurement system is provided. The arrangement further comprises at least one diffractive optical element (DOE) for dividing the illumination beam path into partial beam paths for different boundary surfaces and/or for combination and mutual adaptation of the wavefronts of measurement light components proceeding from different boundary surfaces and/or for adaptation of the wavefronts of measurement light components proceeding from different boundary surfaces of the eye to the wavefront of the measurement light of at least one interferometric reference arm.


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