The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 1997

Filed:

Feb. 16, 1996
Applicant:
Inventors:

Alexander Mordehai, Mountain View, CA (US);

Sidney E Buttrill, Jr, Palo Alto, CA (US);

Assignee:

Varian Associates, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250281 ; 250292 ; 250288 ;
Abstract

A mass spectrometer system for performing a separation of ions from neutrals and mass analyzing ions comprising an ion generating source with an ion introduction system, a radio-frequency ion guide and a mass analyzer disposed within a vacuum chamber. The radio-frequency ion guide is positioned with respect to the ion introduction system so that a main axis of the radio-frequency ion guide is angled toward a central axis of the ion introduction system. The trajectory of the ions is diverted toward the main axis of the radio-frequency ion guide while neutrals continue their flow along the central axis. The ions from the ion introduction system are transported via the radio-frequency ion guide to the mass analyzer.


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