The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 1997

Filed:

Aug. 02, 1991
Applicant:
Inventors:

Masaaki Tamura, Fuchu, JP;

Ayako Fujii, Kawasaki, JP;

Yoshiko Kobari, Kawasaki, JP;

Mamoru Nagano, Yokohama, JP;

Kiyoshi Watanabe, Kawasaki, JP;

Hidehiko Morinaga, Tokyo, JP;

Shigeki Koyama, Yokohama, JP;

Yoshikazu Sawada, Inagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
395171 ; 395133 ;
Abstract

A figure pattern is processed by modifying a point array that forms the figure pattern. The modification may include moving the points of the array, inserting points into the array, deleting points of the array, and changing the attributes of the points or the point array. According to one arrangement, a sample point of an array forming the outline of a figure pattern is designated for deletion and a figure pattern corresponding to the sample point array is generated on the basis of an attribute of sample points adjacent to the sample point designated for deletion.


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