The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1997
Filed:
Sep. 15, 1994
George W Rogers, King George, VA (US);
Carey E Priebe, King George, VA (US);
Jeffrey L Solka, Fredericksburg, VA (US);
Richard A Lorey, Dahlgren, VA (US);
Erik G Julin, Fredericksburg, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Image analysis is performed by defining segmentation boundaries within an image by using wavelet theory or some other suitable method. Such boundaries can be incomplete, irregular, and/or multi-valued. The segmentation boundaries are then incorporated into feature calculations related to fractal dimensions for each pixel using a diffusion related method or a Dijkstra potential related method. These features are then used in statistical techniques to distinguish among textures or classes of interest. The system performing the image analysis is trained (or supervised) on data from different classes within an image or images. This enables the system to then later identify these classes in different images. The system can be used for Computer Aided Diagnosis (CAD) of mammograms or other medical imagery.