The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1997
Filed:
May. 09, 1996
Tsuyoshi Sato, Tokyo, JP;
Abstract
A three-dimensional form measuring apparatus of the present invention comprises (i) an optical distance measuring equipment for irradiating an object to be measured with slit-like irradiation light and for receiving, on a two-dimensional light receiving sensor, reflected light from the object; (ii) a position setting mechanism for setting a relative positional relationship between the optical distance measuring equipment and the object; (iii) a signal selecting section which detects whether or not the width and maximum luminance of an optical image reflected by the object are within a predetermined range and thereby selects, as an output signal for preparing data, an output signal of the two-dimensional light receiving sensor concerning the relative positional relationship between the optical distance measuring equipment and the object set by the position setting mechanism; and (iv) a form data preparing section which prepares a three-dimensional form data of the object based on the output signal of the two-dimensional light receiving sensor selected by the signal selecting section. Accordingly, errors in measurement caused by the inclination of the measuring surface are reduced, whereby the three-dimensional form of the object can be stably measured with a high accuracy.