The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 1997

Filed:

Jun. 21, 1996
Applicant:
Inventors:

Andrei Csipkes, Columbia, MD (US);

John Mark Palmquist, Lilburn, GA (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 356345 ; 385 78 ;
Abstract

A return loss determination system contactlessly and automatically determines a product-to-product return loss of an optical fiber connector having a domed optical fiber termination endface (i.e., an endface having an optical fiber and a surrounding support ferrule). The return loss determination system includes (a) an undercut/protrusion (U/P) inspection system for determining a U/P parameter corresponding with an offset of the fiber relative to a curvature of the ferrule along an axis of the fiber, (b) a dome polish eccentricity (DPE) inspection system for determining a DPE parameter corresponding with a displacement in a plane perpendicular to the axis between a curvature center of the curvature and a fiber center of the fiber, (c) a curvature radius (CR) inspection system for determining a CR parameter corresponding with a radius of the curvature relative to the curvature center, (d) a discontinuity inspection system for determining a discontinuity parameter to quantify surface discontinuities in the fiber, and (e) a return loss evaluation system for determining a return loss of the connector based upon the parameters.


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