The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 1997

Filed:

Jul. 16, 1996
Applicant:
Inventors:

Hong-Tai Man, Basking Ridge, NJ (US);

Iain A McCulloch, Murray Hill, NJ (US);

Hyun-Nam Yoon, New Providence, NJ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 96 ; 324753 ; 359245 ; 359257 ;
Abstract

This invention provides an electrooptic sensor device which is adapted to measure micro-circuit electrical signals with subpicosecond resolution. The sensor device has an electrooptic organic polymer film matrix. The sensor device is positioned adjacent to an electrical signal transmission line of a micro-circuit, and within a fringe electric field of the transmission line. Birefringence is induced in the electrooptic polymer film matrix by the fringe electric field generated by a propagation electrical signal in the transmission line. An optical probe beam of focused electrical signal-synchronized laser pulses of picosecond range duration is beamed into the birefringent polymer film matrix, and the output laser pulses are processed to provide an optical profile measurement of the electrical signal.


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