The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 1997
Filed:
Nov. 12, 1996
Raymond J Guertin, East Greenwich, RI (US);
YuZhong Dai, Coventry, RI (US);
Vitaly Pesikov, Providence, RI (US);
Walter L Beckwith, Jr, Warwick, RI (US);
Thomas Charlton, Jr, North Kingstown, RI (US);
Brown & Sharpe Manufacturing Company, North Kingstown, RI (US);
Abstract
A coordinate measuring machine includes a support structure, an articulated arm having a first end pivotally connected to the support structure and a second end that is movable in a horizontal plane. A Z-ram assembly is mounted to the second end of the articulated arm. The Z-ram assembly includes a Z-ram housing and a probe that is vertically movable with respect to the Z-ram housing. The probe is movable within a measurement volume defined by the articulated arm and the Z-ram assembly. The coordinate measuring machine further includes a measuring assembly for determining coordinates of the probe in the measurement volume. The articulated arm preferably includes first and second arm assemblies that have a parallelogram configuration to prevent substantial rotation of the Z-ram assembly as the articulated arm is moved in the horizontal plane. The angles of the articulated arm are preferably measured using a sensor which includes a pattern of parallel, straight grating lines.