The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 1997

Filed:

Jul. 22, 1994
Applicant:
Inventors:

Seiji Hamano, Osaka, JP;

Takashi Ichiyanagi, Hirakata, JP;

Tsuyoshi Nomura, Kyoto, JP;

Kouhei Hamamura, Hirakata, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
382242 ; 345442 ;
Abstract

A method for processing three-dimensional shape data includes steps of obtaining a plurality of point data along a surface of an object having a three-dimensional shape; taking out a point data from the obtained point data to be processed, approximating each specified number of point data in the to-be-processed point data adjacent the taken-out point data by a polynomial and then finding two unit vectors at the taken-out point data; finding an opening angle defined between the two found unit vectors; comparing the found opening angle with a predetermined threshold value of the opening angle, determining whether or not the found opening angle is not larger than the threshold value, and thinning the taken-out point data when the found opening angle is larger than the threshold value and not storing the taken-out point data in a storage unit, and leaving the taken-out point data without the thinning when the found opening angle is not larger than the threshold value and storing the taken-out point data in the storage unit.


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