The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 1997

Filed:

Oct. 18, 1996
Applicant:
Inventors:

Stanley H Fox, Brookfield, WI (US);

Robert Senzig, Germantown, WI (US);

Jiang Hsieh, Waukesha, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378-4 ; 378 62 ; 378901 ;
Abstract

Methods and apparatus for scanning an object in a computed tomography system during an interventional procedure are described. The computed tomography system includes an x-ray source, a detector, and a display. The detector detects x-rays projected from the x-ray source and attenuated by an object. A processor is coupled to the detector and coupled to the display for generating images of the object on the display. A helical scan is executed to generate an image slice of the object corresponding to each gantry rotation. At least one image slice and one three-dimensional image are simultaneously displayed on the display.


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