The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 1997
Filed:
Jun. 03, 1994
Seiji Maruo, Hitachi, JP;
Akira Arimoto, Kodaira, JP;
Yoshihito Maeda, Mito, JP;
Tatsuya Sugita, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Koki Co., Ltd., Tokyo, JP;
Abstract
An optical arrangement for an optical scanning apparatus which can record a plurality of high precision information concurrently, provides for a laser beam emitted from a single light source to be polarized in two polarization directions, and each of the two polarized beams is further imparted with different information according to its polarization direction. Then, the two polarized beams are used for scanning over a photosensitive member to concurrently record respective information at different positions on the photosensitive member. In order to suppress induced light fluctuation depending on an incident angle of light on the beam splitter, an optical rotation means is provided in the optical system, such that a desired optical rotation control can be obtained corresponding to the incident angle on the beam splitter, so as to compensate for the fluctuation of light whereby the beam splitter can be arranged to be free of the influence of the incidence angle of the beam.