The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 1997

Filed:

Feb. 23, 1996
Applicant:
Inventors:

Kurt Peter Weckstrom, Espoo, FI;

Pekka Tuomo Merilainen, Helsinki, FI;

Borje Tor Rantala, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504951 ; 2504941 ; 2505 / ; 250343 ;
Abstract

A radiation source assembly for optical transducers used for the analysis of material components of media, whereby the radiation source assembly comprises: two thermal radiation sources (1, 2), of which the first radiation source (1) is located, in relation to the second radiation source, in such a position that it emits through the second radiation source (2); a band-stop filter (10) located between the first and the second radiation sources, so that the radiation (6) emitted by the first radiation source passes through it. Both thermal radiation sources (1, 2) comprise a substrate (3, 11) made of silicon, of a silicon mixture or of a silicon compound, and a recess (53) made in the substrate, and micro-filaments (4, 5), which are fastened at their ends to the outer surface (51, 52) of the substrate, their radiation (6, 8) emitting regions being at a distance (H) from the bottom surface (54) of the recess. The stop band of the band-stop filter (10) substantially corresponds to the absorption distribution of the material component of the medium to be analyzed with the transducer.


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