The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1997
Filed:
Apr. 09, 1996
Akihiko Uchiyama, Yokohama, JP;
Haruo Fujii, Yokohama, JP;
Hiroshi Sasame, Yokohama, JP;
Tatsuya Kobayashi, Soka, JP;
Tetsuya Kobayashi, Kawasaki, JP;
Naoki Enomoto, Yokohama, JP;
Yoshiro Saito, Yokohama, JP;
Yoichiro Maebashi, Kawasaki, JP;
Takaaki Tsuruya, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
By altering a developing bias, a plurality of patch images are formed on a photoconductor, and a density of each patch image is measured, thereby judging whether or not a target density value is within a range of the plurality of measured density values. If the target density value is outside the range, a developing bias which realizes the target density is obtained by an interpolation, in accordance with two measured density values that are closest to the target density value among a plurality of measured densities, and with a developing bias of two patch images that are related to these two measured density values.