The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 1997

Filed:

Jun. 25, 1996
Applicant:
Inventors:

Bernd Ohnesorge, Erlangen, DE;

Ernstpeter Ruehrnschopf, Erlangen, DE;

Klaus Klingenbeck-Regn, Nuremberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378-7 ; 378 9811 ; 378 9812 ;
Abstract

An x-ray examination apparatus with a detector array having a number of detector elements includes a data correction computer in which the subject-scattered radiation can be numerically determined and corrected. The forward scatter intensity is determined by multiplication of the measured intensities, windowed with a window function, with the natural logarithm of the intensity normalized with the unattenuated primary intensity. The subject-scattered radiation can then be calculated and corrected through filtering of the forward scatter intensity with a convolution kernel and a suitable scaling.


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