The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1997
Filed:
Sep. 19, 1995
Applicant:
Inventors:
Hironori Takahashi, Hamamatsu, JP;
Kazuhiko Wakamori, Hamamatsu, JP;
Musubu Koishi, Hamamatsu, JP;
Akira Takeshima, Hamamatsu, JP;
Assignee:
Hamamatsu Photonics K.K., Hamamatsu, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324753 ; 324 96 ;
Abstract
In this system, reflected light from an electro-optic probe is detected by a photodetector, and only a voltage signal of a frequency which is an integral multiple of the fundamental frequency of the output voltage from the photodetector is detected. The frequency characteristics of the output voltage from the photodetector can be measured at a high speed and a high accuracy.
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Takahashi, Hironori. (1997). Voltage measuring using electro-optic material's change in refractive (U.S. Patent No. 5666062). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5666062
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile