The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1997
Filed:
Oct. 04, 1995
Holger Heuermann, Tittmoning, DE;
Burkhard Schiek, Bochum, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Rosengerger Hochfrequenztechnik GmbH & Co., Tittmoning, DE;
Abstract
In a method for calibrating a network analyzer having two test ports and at least four measuring locations according to the fifteen-term principle, correction values that are taken into consideration in the following subject measurements are calculated by successive measurement of the transmission and reflection parameters at five calibration standards that are successively connected in arbitrary sequence between the two test ports. A one-port network having a known impedance or open circuit is used as a calibration standard for the first calibration measurement. It is being successively connected to the two test ports (MM or OO double one-port network calibration) and four calibration standards are used for the other four calibration methods. Only eleven of the total of sixteen scatter parameters of these four calibration standards are known, whereas the remaining, five unknown scatter parameters are subsequently calculated from the total of measured values.