The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 1997

Filed:

Oct. 26, 1995
Applicant:
Inventors:

Kouji Tsukada, Aichi-ken, JP;

Hidekazu Nishigaki, Aichi-ken, JP;

Yasuaki Ikeda, Aichi-ken, JP;

Shigeru Sakuma, Aichi-ken, JP;

Shin-ichi Ishiyama, Aichi-ken, JP;

Fumio Matsuoka, Aichi-ken, JP;

Yoshihisa Kanno, Aichi-ken, JP;

Shigeki Hayashi, West Bloomfield, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01M / ;
U.S. Cl.
CPC ...
73849 ; 738664 ;
Abstract

A bending strain measurement apparatus for an abdomen of an anthropomorphic dummy comprises a band constituted of an elastic thin plate member. The band is arranged in a longitudinal direction of the abdomen, has one end thereof fixed in the vicinity of the abdomen of the dummy, and a plurality of gauges are arranged in a longitudinal direction of the band for detecting a bending strain of the abdomen when an obstacle collides with the abdomen. A measuring device measures time history of the bending strain based on bending strain of the respective portions of the band detected by the gauges arranged on the band, as a time transition of the bending strain of respective portions of the band.


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