The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1997
Filed:
Apr. 10, 1995
Applicant:
Inventor:
Akira Miike, Sunto-gun, JP;
Assignee:
Kyowa Medex Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436526 ; 436531 ; 436546 ; 436800 ; 436813 ; 436817 ; 5303913 ;
Abstract
The present invention provides a new analytical method that an antigen, an antibody or a nucleic acid can be assayed at a high sensitivity in the immunoassay. The present invention provides a method for assaying a substance which comprises the steps of (a) reacting an antigen, an antibody or a nucleic acid which is the substance to be measured with an antibody, an antigen or a nucleic acid to which a polyacridinium compound is bound and which can be bound to the substance to be measured, (b) carrying out a luminescence treatment, and (c) measuring the luminescent intensity of the reaction solution.