The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1997
Filed:
Jul. 31, 1995
John Edwin Graebner, Short Hills, NJ (US);
Sungho Jin, Millington, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
This invention involves apparatus for determining the thermal resistivities W.sub.s (=1/.kappa..sub.s) of electrically insulating, crystalline or polycrystalline samples under test (SUTs), all comprising host material such as CVD diamond. Once the optical absorptivities .alpha..sub.1 and .alpha..sub.2 and the thermal resistivities W.sub.1 and W.sub.2 of at least two other crystalline or polycrystalline bodies B.sub.1 and B.sub.2, respectively, comprising the same host material as the SUTs, and containing the same type of impurity or combination of impurities as the SUTs, are measured by some other technique--the inventive apparatus can then determine the thermal resistivities W.sub.s of the SUTs rather quickly from a measurement only of the optical absorptivities a.sub.s of the SUTs. These determinations of the thermal resistivities W.sub.s of the SUTs rely on our discovery that the following linear relationship exists: W=A+C.alpha., where A and C are constants so long as the type of impurity or combination of impurities in all the bodies B.sub.1, B.sub.2, and SUTs is the same, even though the impurities or combination of impurities have different concentrations in the bodies B.sub.1 and B.sub.2, as well as in the SUTs.