The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 1997
Filed:
Jan. 24, 1996
Applicant:
Inventors:
Alastair D McAulay, Allentown, PA (US);
Junqing Wang, Bethlehem, PA (US);
Assignee:
Competitive Technologies of PA, Inc., Bethlehem, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
356398 ; 356237 ; 2502376 ;
Abstract
A technique for detecting damage of leads arranged in a generally parallel periodic pattern, includes the following steps: directing a coherent light beam at a plurality of adjacent leads; detecting an image at a distance from the leads at which the light beam would form a diffraction image having substantially uniform intensity when the leads form a substantially uniform pattern; moving the pattern of leads and the light beam with respect to each other; and detecting damage of leads from variation in intensity of the detected image.