The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 1997
Filed:
Aug. 26, 1993
G. Rodenstock Instrumente GmbH, Ottobrunn-Riemerling, DE;
Abstract
Disclosed is an apparatus for examining objects having an illumination light source, the light of which can be focussed on the part of the object to be examined, a scanning device, which generates a scanning movement of the light beam from the illumination light source over the section to be examined and which is provided with beam-deflecting and beam-imaging optical elements, a sensor device, which receives the light reflected from said section to be examined, and an evaluation and synchronization unit, which produces an image of said section to be examined from the time-sequential output signal from said sensor device. The invented apparatus is distinguished by the fact that the optical axis of the examination and/or illumination beam can be shifted in a plane of said pupils in order to generate a stereoscopic image, and that the images produced with varying positions of the optical axes can be overlapped in order to produce a stereo image.