The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 1997

Filed:

Apr. 05, 1993
Applicant:
Inventor:

Gregory Linville, Oxnard, CA (US);

Assignee:

DHV International, Inc., Ventura, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348 85 ;
Abstract

An instrument probe contains an improved camera and light source arrangement which; and is positioned behind the camera for providing indirect illumination of the passage being inspected by the camera such as the contents of the bore hole or its casings. The light source is physically separated from the camera thus providing insulation to the camera from heat produced by the light source. The camera housing comprises a quick connect and disconnect latch which allows for the swift changeover of camera components at the distal end of the instrument probe. A parabolic reflector at the light source directs light distally to the instrument body. A second reflector is located on the camera body to further reflect light towards the walls of the passageways, thereby enhancing the indirect light funneled to the area being inspected by the camera.


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