The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 1997
Filed:
Sep. 29, 1995
Applicant:
Inventor:
Yasuhiko Matuyama, Nagasaki, JP;
Assignee:
Sony Magnescale Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01D / ; G01D / ; G01D / ;
U.S. Cl.
CPC ...
32420712 ; 32420724 ; 324225 ;
Abstract
A position detecting apparatus for a scale measuring system executes a offset correction of the detected three-phase signals A, B and C by using the arithmetic mean (A+B+C)/3 as an offset value. Further, the apparatus executes a gain correction of the offset corrected signals by using a gain which is obtained by the calculation of a square-root of {A.sup.2 +(B-C).sup.2 /3}. Therefore, the accurate measurement is executed by this apparatus even if the gain level is changed at a turn-on of an electric source of this apparatus.
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Matuyama, Yasuhiko. (1997). Position detecting apparatus using offset calculated from sum of (U.S. Patent No. 5663643). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5663643
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