The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 1997

Filed:

Feb. 20, 1996
Applicant:
Inventors:

Stephen J Herbst, Redondo Beach, CA (US);

Weston Furukawa, Los Angeles, CA (US);

Assignee:

Hughes Electronics, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; H04N / ;
U.S. Cl.
CPC ...
250332 ; 250334 ; 348295 ;
Abstract

A system for producing a high quality scene image in a thermal imaging system by electronically compensating for variations in the imaging system imager focal length. The system includes optics (16, 18) for detecting a scene (14), a detector assembly (27) being responsive to energy from the detected scene; and an imager (25) for imaging the energy from the detected scene onto the detector assembly (27). The imager (25) includes a temperature sensor (25b) for sensing imager lens temperature. The detector assembly (27) outputs electric signals in response to the energy from the detected scene at a first clock sample rate. The system further includes a processor (84) for controlling the first clock sample rate of the detector assembly to maximize detected scene image quality through variation of the first clock sample rate to automatically compensate for imager lens focal length variation due to ambient temperature changes in the imager lens (25a) and due to inherent manufacturing tolerances.


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