The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 1997

Filed:

Feb. 08, 1995
Applicant:
Inventors:

Stanley Robert Jordan, Boca Raton, FL (US);

Howard Herbert Nick, Lagrangeville, NY (US);

Brock Estel Osborn, Hyde Park, NY (US);

Chang-Yu Wu, Wappingers Falls, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01T / ;
U.S. Cl.
CPC ...
364481 ; 364579 ; 324 725 ;
Abstract

A system having a computer, test control logic, an electrostatic discharge unit and a high voltage probe unit is provided for performing multiple, random, asynchronous electrostatic discharge testing of machines. The test control logic includes multiple, asynchronous, random, firing logic for controlling the states of a plurality of output lines which send control signals from the computer to the electrostatic discharge unit and the high voltage probe unit. The test control logic allows a user a preference of testing modes through an interactive input graph. The user may specify either a run time experiment or a specific probability of test coverage test.


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