The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 1997

Filed:

May. 30, 1995
Applicant:
Inventor:

Kunio Muramatsu, Yokosuka, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
341120 ; 341156 ; 341158 ; 341159 ;
Abstract

An A/D converter and a method of testing the same. Resistors R1 to Rn are connected in series between power-supply terminals receiving a high potential and a low potential, respectively. The potentials at the nodes of the resistors R1 to Rn are input to voltage comparators C1 to Cn-1, respectively. Each comparator compares the input potential with an input signal Vin. The output signals of comparator is supplied to an encoder. The encoder converts the input signals into a digital signal. A test terminal is connected to one of the nodes of the resistors R1 to Rn. Either the high potential at the terminal or the low potential at the terminal is applied to the test terminal to test the A/D converter.


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