Fabrication, testing and repair of multichip semiconductor structures

Abstract

A multichip semiconductor structure and fabrication method having connect assemblies with fuses which facilitate burn-in stressing and electrical testing of the structure are presented. The structure comprises a multichip stack having standard transfer wire outs to an edge surface thereof. At least some wire outs to the edge surface have fuses electrically series connected thereto such that should an excessive current source/sink arise during burn-in stressing, the corresponding fuse will open circuit. A conductive structure is also disclosed that facilitates the formation of final, operational metallization wiring on the edge surface of the multichip structure prior to burn-in stressing and testing. This conductive structure includes a first conductive level and a second conductive level. The first conductive level has isolated conductors with ends disposed in close proximity. The second conductive level includes islands of strap conductors that electrically interconnect the isolated conductors of the first conductive level. The first conductive level and a second conductive level are constructed of different conductive material which may be separately etched so that the second conductive level may be removed without affecting this first conductive level.