The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 1997
Filed:
Aug. 23, 1996
Peter Dilwyn Evans, Cardiff, GB;
Nicholas Barnett, Cardiff, GB;
Johnson & Johnson Medical, Inc., Arlington, TX (US);
Abstract
Method of quantitatively determining one or more characteristics of a substance using near infrared spectroscopy. The method including irradiating a point of the substance with radiation at at least two distinct wavelengths, measuring the intensity of the radiation detected at two locations, determining the optical path lengths of the radiation between the irradiation point and the two detecting locations, and determining the effect of the divergence of the radiation reaching two locations. The relative coupling efficiencies of the two detectors are determined by the use of a second emission point equidistant from the two detectors. The characteristic being measured is then determined by the intensity of the radiation detected at the detecting locations with the result modified by accounting for the optical path lengths to the detecting locations, the detector coupling efficiencies and the effect of divergence of the radiation before reaching the detecting locations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile