The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Oct. 29, 1996
Applicant:
Inventors:
David Lee, Murray Hill, NJ (US);
Krishan Kumar Sabnani, Berkeley Heights, NJ (US);
Muharrem Umit Uyar, Sea Bright, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
371 271 ; 39518309 ; 371 251 ;
Abstract
A method and apparatus is disclosed for conformance testing of protocols specified as a collection of communicating finite state machines (FSMs). A guided random walk procedure is advantageously used to cover a substantial number of transitions in the component FSMs to determine if the FSM output corresponds to the protocol as specified.