The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Aug. 07, 1995
Makoto Kamioka, Kasuga, JP;
Yoshihiro Gotou, Chikushino, JP;
Abstract
An optical beam scanning apparatus comprises: an beam source emitting an optical beam; a deflector deflecting the optical beam around a center line with a deflection angle .theta. radians in a main scanning direction perpendicular to the center line at a constant angular velocity d.theta./dt; a lens system, having a focal length f in the main scanning direction, for focusing the optical beam on a recording plane perpendicular to the center line to form and scanning a beam spot on the recording plane at a constant speed in the main scanning direction, wherein the lens system refracts the optical beam from the deflection means such that the constant speed is larger than f.multidot.d.theta./dt. An emitting angle from the lens system is larger than the deflection angle by the deflector. The deflector comprises a polygon mirror unit. The lens system may have a function to compensate a surface inclination in the polygon mirror unit. That is, the lens system includes toric surfaces including at least a rotation symmetric aspheric surface and at least a spherical surface or one of the plurality refracting surfaces has a toric surface having an aspheric surface and other refracting surfaces have rotation symmetric aspheric surfaces. A collimating lens unit may be provided between the beam source and the deflector. Units necessary for recording data may be further provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile