The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Feb. 16, 1995
Carla Maria Golla, Sesto San Giovanni, IT;
Marco MacCarrone, Palestro, IT;
SGS-Thomson Microelectronics S.r.l., Agrate Brianza, IT;
Abstract
A method for programming non-volatile row redundancy memory registers. Each register is associated with a respective pair of redundancy row and each one programmable to store in two subsets of a set of memory cells a pair of addresses of a respective pair of adjacent defective rows. Each memory register is supplied with row address signals and with a respective selection signal belonging to a set of column address signals. The method provides for: applying to the row address lines the address of a first defective row of the pair of adjacent defective rows; activating one of the selection signals for selecting the register which is to be programmed; applying to a further column address line a first logic level to select for programming in the selected memory register, a first subset of memory cells; enabling the programming of the address of the first defective row of the pair of adjacent defective rows into the first subset of memory cells; applying to at least a subset of the row address lines the address of the second defective row of the pair; applying to the further column line a second, opposite logic level to select for programming, in the selected memory register, at least a group of memory cells of the second subset of the two subsets of memory cells; and enabling the programming of the address of the second defective row of the pair of adjacent defective rows into the second subset of memory cells.