The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Nov. 13, 1995
Thomas Willliam Dey, Springwater, NY (US);
Kenneth L Mason, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A radiometric calibration system is proposed to calibrate the sensor array of a space born optical imaging system. The calibration system comprises an occulting plate with an occulting convolution aperture which executes a relative lateral motion with respect to an image of the sun, to effect a deterministic and continuously varying calibration flux level to the sensor array. The shape, size orientation and apodization of the aperture control the functional form of the temporal irradiance function reaching the sensor being calibrated. Continuous calibration functions covering a range from a minimum to a maximum desired flux level are readily achievable.