The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Jun. 07, 1995
Alfredo Choperena, Eden Prairie, MN (US);
Ross Krogh, Minneapolis, MN (US);
Venkatesh Prasad, Eden Prairie, MN (US);
Gershon Giter, St. Paul, MN (US);
Pasteur Sanofi Diagnostics, , FR;
Abstract
The invention provides a method for analyzing samples for different analytes. A plurality of assay resource stations are provided, each of which includes an assay resource capable of performing a predetermined operation upon a reaction vessel within a time cycle of fixed duration, as is an analyzer control means. Information identifying two samples and the analyte to be determined in each is provided to the analyzer control means. Assay resource requirements for the first assay are determined as a function of an integral number of time cycles and appropriate time cycles of each required assay resource are allocated to the first assay. Assay resource requirements for the second assay are also determined as a function of an integral number of time cycles and time cycles are allocated to the second assay according to the availability of the assay resources. The first and second assays are processed by automatically transferring each reaction vessel from one required assay resource station directly to the next required assay resource station.