The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 1997

Filed:

Mar. 08, 1995
Applicant:
Inventors:

Kazutaka Okada, Iwatsuki, JP;

Tsuyoshi Mitake, Noda, JP;

Akira Sasaki, Ichikawa, JP;

Hiroshi Kanda, Tokorozawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866001 ;
Abstract

An ultrasonic diagnosis system includes a probe and a diagnosis processing apparatus. Ultrasonic transmission signal-transmission power characteristic intrinsic to the probe is previously measured and a transmission power identifying signal indicating the characteristic is imparted to the probe itself. Upon connection of the probe to the diagnosis processing apparatus, the transmission power identifying signal is inputted to a CPU of the diagnosis processing apparatus which includes a memory for storing correcting data corresponding to ranks of the characteristics. The CPU reads out from the memory the correcting data on the basis of the inputted transmission power identifying signal indicating the rank of the probe for thereby correcting the ultrasonic transmission signal. When the characteristic of the probe as connected is such that greater transmission power is outputted for the basic transmission signal when compared with the standardized or design level, amplitude of the ultrasonic transmission signal is corrected to be smaller so that the transmission power assumes the standard or design value. The power sent from the probe thus coincides with the design value regardless of variance in the characteristic of the probe.


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