The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1997
Filed:
Jun. 07, 1995
Jiri Vrba, Port Coquitlam, CA;
Gordon James Haid, Pitt Meadows, CA;
Wai Meng Lee, Coquitlam, CA;
Brent Ronald Taylor, Coquitlam, CA;
Mark Alan Tillotson, Maple Ridge, CA;
CTF Systems Inc., Port Coquitlam, CA;
Abstract
A method and system of obtaining magnetic measurements with a preselected order of sensor gradiometer which are substantially equivalent to those which would be obtained with a sensor gradiometer of a higher order. The system and method employs a reference system comprising reference tensor gradiometers and appropriate components of a measured tensor are combined with the measurements obtained from the sensor gradiometer to obtain a magnetic measurement substantially equivalent to that which would have been measured by a higher order sensor gradiometer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile