The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 1997
Filed:
Feb. 24, 1995
Applicant:
Inventors:
Gerard De Haan, Eindhoven, NL;
Tatiana G Kwaaitaal-Spaasova, Eindhoven, NL;
Olukayode A Ojo, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ;
U.S. Cl.
CPC ...
382275 ; 382260 ; 382271 ; 382273 ; 382272 ; 348607 ;
Abstract
In a method of measuring noise in image signals, a number of noise estimates (SAD) is calculated (1). Subsequently, it is determined (3-9) which noise estimation interval [A, B] out of a plurality of predetermined noise estimation intervals [A, B] contains at least a predetermined number of noise estimates (SAD) and has at the same time the lowest upper interval boundary. The output noise measurement value depends on the determined noise estimation interval.