The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 1997
Filed:
Apr. 12, 1996
Applicant:
Inventor:
Robert M Wolff, Fremont, CA (US);
Assignee:
Samsung Information Systems America, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518301 ; 39518306 ; 395701 ; 364267 ; 3642624 ; 364D / ;
Abstract
An apparatus and method for testing the installation and functioning of a component of computer system has a test engine which causes the identity of a test to be performed to be stored in a nonvolatile memory before being performed. The test is announced to the installer and then ran. This procedure is performed for a sequence of tests. In the event of a crash during testing, the step-by-step sequencing of the tests and the storage of the test identifies step-by-step in the nonvolatile memory simplifies identification of the test that caused the crash for the installer.