The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 1997

Filed:

Jun. 28, 1994
Applicant:
Inventor:

Gary A Crocker, San Diego, CA (US);

Assignee:

Computervision Corporation, Bedford, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G00T / ;
U.S. Cl.
CPC ...
395120 ;
Abstract

The invention relates to a method and apparatus for tracking and modifying the accumulated error and the current operational tolerance of each topological entity in a geometric model of a three dimensional object. Each topological entity has assigned to it a Mintol value and a Maxtol value, Mintol represents the current accumulated error associated with the entity. Maxtol represents the operational tolerance of the entity for future operations. The Mintol value for an entity is set and occasionally adjusted so that it comprises a volume which encompasses all other entities adjacent to the particular entity. With respect to Maxtol, when two entities are within a distance from each other which is less than the sum of the Maxtols of the two entities, the two entities can be combined. Maxtol is adjusted whenever Mintol is adjusted so as to remain larger than Mintol and whenever a new entity is created by the combination of old entities, so as to encompass the Maxtols of the two old entities.


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