The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 1997
Filed:
Oct. 30, 1996
Mark R Rutenberg, Monsey, NY (US);
Robert Tjon-Fo-Sang, Valley Cottage, NY (US);
Leonid Strinkovsky, Spring Valley, NY (US);
Laurie J Mango, Roosevelt Island, NY (US);
James C Herriman, Huntington Station, NY (US);
Neuromedical Systems, Inc., Suffern, NY (US);
Abstract
A device for the visual inspection of a specimen, comprising a first microscope for obtaining a magnified view of different areas of a specimen, a display monitor for displaying images of at least a subset of the different areas of the specimen, selection means for enabling the selection of a image displayed on the monitor, a second microscope for review of an area of the specimen corresponding to the selected image, a motorized stage for positioning said specimen with respect to the field of view of the second microscope, and a processor for determining the image selected and instructing the motorized stage to position the specimen so that the area of the specimen corresponding to the selected image is in the field of view of the second microscope.