The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 1997
Filed:
Mar. 15, 1996
Kevin C Sullivan, Anaheim, CA (US);
Manuel R Cabison, San Gabriel, CA (US);
Isidor Kerszenbaum, Irvine, CA (US);
Juan P Lopetrone, Fountain Valley, CA (US);
Tom Baker, Fountain Valley, CA (US);
Southern California Edison Company, Rosemead, CA (US);
Abstract
An analyzer for performing high and low voltage tests on an electric induction machine having electric power input terminals. The analyzer comprises: (a) a high voltage testing circuit for performing high voltage tests on the induction machine; (b) a low voltage testing circuit for performing low voltage tests on the induction machine; (c) electrical terminals for electrical connection with the power input terminals of the induction machine; (d) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch; and (e) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to: (i) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and (ii) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches.